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Krzysztof Kryszczuk

 

BIOGRAPHY

 

Krzysztof Kryszczuk obtained his doctorate in Pattern Recognition from the Swiss Federal Institute of Technology Lausanne (EPFL), Signal Processing Institute, in 2007. He is a co-founder of PatternLab, a scientific consulting company based in Lausanne, Switzerland. Prior to joining EPFL, Krzysztof was a Research Engineer at the National University of Singapore. He obtained his M.S. degree in psychology (cognitive systems engineering) from the Rensselaer Polytechnic Institute in 2001, and the M.S. degree in electrical engineering from the Lublin Institute of Technology in 1999. In 2007, Krzysztof received the European Biometrics Forum Research Award. His research interests include pattern recognition, machine learning, biometrics, Bayesian methods, image processing, and human-machine interactions.

 

Click here for full CV

 

My PhD thesis can be found here [pdf]

PUBLICATIONS

 

Impact of feature correlations on separation between bivariate normal distributions, K. Kryszczuk, A. Drygajlo, to appear in: International Conference on Pattern Recognition (ICPR) 2008, Tampa FL, USA, December 2008

What do quality measures predict in biometrics?, K. Kryszczuk, A. Drygajlo, 16th European Conference on Signal Processing EUSIPCO 2008, Lausanne, Switzerland, August 2008

On quality of quality measures for classification, K. Kryszczuk, A. Drygajlo, BIOID 2008, Roskilde, Denmark, May 2008

Credence estimation and error prediction in biometric identity verification, K. Kryszczuk, A. Drygajlo, Signal Processing, November 2007
Quality measures in unimodal and multimodal biometric verification, J. Richiardi, K. Kryszczuk, A. Drygajlo, 15th European Conference on Signal Processing EUSIPCO 2007, Poznan, Poland.
Improving classification with class-independent quality measures: Q − stack in face verification, K. Kryszczuk, A. Drygajlo, 2nd International Conference in Biometrics ICB2007, Seoul Korea, August 2007
Reliability estimation for multimodal error prediction and fusion, K. Kryszczuk, J.Richiardi, A. Drygajlo, 7th International Workshop on Pattern Recognition in Information Systems (PRIS-2007), Funchal, Portugal
Q − stack: uni- and multimodal classifier stacking with quality measures, K. Kryszczuk, A. Drygajlo, 7th International Workshop on Multiple Classifier Systems 2007, Prague, Czech Republic
Reliability-based decision fusion in multimodal biometric verification systems, K. Kryszczuk, J.Richiardi, P.Prodanov, A. Drygajlo, EURASIP Journal on Advances in Signal Processing Volume 2007 (2007), Article ID 86572, 9 pages, doi:10.1155/2007/86572
Quality Dependent Fusion of Intramodal and Multimodal Biometric Experts, J. Kittler, N. Poh, O. Fatukasi, K. Messer, K. Kryszczuk, J. Richiardi and A. Drygajlo, Proc. of SPIE Defense & Security, 9–13 April 2007, Orlando, Florida USA.
Singular point detection in fingerprints using quadrant change information, K. Kryszczuk, A. Drygajlo, Proc. of the International Conference on Pattern Recognition (ICPR) 2006, Hong Kong, China.
On Combining Evidence For Reliability Estimation In Face Verification, K. Kryszczuk, A. Drygajlo, Proc. of the 14th European Conference on Signal Processing (EUSIPCO) 2006, Florence, Italy
On Face Quality Measures, K. Kryszczuk, A. Drygajlo, Proc. 2nd Workshop on Multimodal User Authentication, Toulouse, France, 2006
Robust Method of Reference Point Localization in Fingerprints, K. Kryszczuk, A. Drygajlo, Proc. COST 275 Workshop on Biometrics on the Internet, Hatfield, UK, pp. 7-10, Oct 2005
Error Handling In Multimodal Biometric Systems Using Reliability Measures, K. Kryszczuk, J.Richiardi, P.Prodanov, A. Drygajlo, Proc. of the 13th European Conference on Signal Processing EUSPICO 2004, Antalya, Turkey, 4-8 September 2005.
Addressing the vulnerabilities of likelihood-ratio-based face verification, K. Kryszczuk, A. Drygajlo, AVBPA 2005, Rye Brook, NY 2005
Face authentication competition on the BANCA database, K. Messer, J. Kittler, M. Sadeghi, M. Hamouz, A. Kostyn, S. Marcel, S. Bengio, F. Cardinaux, C. Sanderson, N. Poh, Y. Rodriguez, K. Kryszczuk, J. Czyz, L. Vandendorpe, J. Ng, H. Cheung, and B. Tang , Proceedings of the International Conference on Biometric Authentication ICBA 2004
Study of the Distinctiveness of Level 2 and Level 3 Features in Fragmentary Fingerprint Comparison, K. Kryszczuk, P. Morier, A. Drygajlo, Proc. of the Biometrioc Authentication Workshop, ICCV 2004, May 15, 2004, Prague
Extraction of Level 2 and Level 3 Features for Fragmentary Fingerprint Comparison, K. Kryszczuk, A. Drygajlo and P. Morier, Proc. of COST275 meeting, March 25-26, 2004 Vigo, Spain
Color Correction For Face Detection Based on Human Visual Perception Metaphor, K. Kryszczuk, A. Drygajlo, Proc. of the Workshop on Multimodal User Authentication, Dec. 11-12, 2003, Santa Barbara, CA USA, pp. 138-143

 

 

 

PatternLab is a scientific consulting company, specialized in biometrics, patternrecognition/machine learning and data mining. For more information visit
www.patternlab.ch

 


last updated : 2008-11-14